Fast Evaluation Method for Transient Hot Spots in VLSI ICs in Packages. - Je-Hyoung Park; Ali Shakouri; Sung-Mo Kang (ISQED, 2008)

Power Blurring: Fast Static and Transient Thermal Analysis Method for Packaged Integrated Circuits and Power Devices. - Amirkoushyar Ziabari; Je-Hyoung Park; Ehsan K. Ardestani; Jose Renau; Sung-Mo Kang; Ali Shakouri (IEEE Trans. Very Large Scale Integr. Syst., 2014)