Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy. - Stefan Dilhaire; Stéphane Grauby; Wilfrid Claeys; Jean-Christophe Batsale (Microelectron. J., 2004)

Applications of temperature phase measurements to IC testing. - Josep Altet; Jean-Michel Rampnoux; Jean-Christophe Batsale; Stefan Dilhaire; Antonio Rubio 001; Wilfrid Claeys; Stéphane Grauby (Microelectron. Reliab., 2004)

Parameters identification in a physical system for thermal efficiency prediction. - Laetitia Perez; Laurent Autrique; Jean-Christophe Batsale (CDC/ECC, 2005)

Multispectral face recognition using non linear dimensionality reduction. - Moulay A. Akhloufi; Abdelhakim Bendada; Jean-Christophe Batsale (Visual Information Processing, 2009)