Failure modes on low voltage power MOSFETs under high temperature application. - Laurent Dupont 002; Stéphane Lefebvre; M. Bouaroudj; Zoubir Khatir; Jean-Claude Faugières (Microelectron. Reliab., 2007)

Estimation of SiC JFET temperature during short-circuit operations. - Mounira Berkani; Stéphane Lefebvre; Narjes Boughrara; Zoubir Khatir; Jean-Claude Faugières; Peter Friedrichs; Ali Haddouche (Microelectron. Reliab., 2009)