Physically-based extraction methodology for accurate MOSFET degradation assessment. - Giulio Torrente; Jean Coignus; Sophie Renard; Alexandre Vernhet; Gilles Reimbold; David Roy 001; Gérard Ghibaudo (Microelectron. Reliab., 2015)

Precise EOT regrowth extraction enabling performance analysis of low temperature extension first devices. - Jessy Micout; Quentin Rafhay; Xavier Garros; Mikaël Cassé; Jean Coignus; Luca Pasini; Cao-Minh Vincent Lu; Nils Rambal; Claire Fenouillet-Béranger; Laurent Brunet; G. Romano; R. Gassilloud; et al. (ESSDERC, 2017)

Thermal laser attack and high temperature heating on HfO2-based OxRAM cells. - Alexis Krakovinsky; Marc Bocquet; Romain Wacquez; Jean Coignus; Jean-Michel Portal (IOLTS, 2017)

Development and application of the Oxide Stress Separation technique for the measurement of ONO leakage currents at low electric fields in 40 nm floating gate embedded-flash memory. - Adam Dobri; Simon Jeannot; Fausto Piazza; Carine Jahan; Jean Coignus; Luca Perniola; Francis Balestra (Microelectron. Reliab., 2017)

Physically-based evaluation of aging contributions in HC/FN-programmed 40 nm NOR Flash technology. - Giulio Torrente; Jean Coignus; Alexandre Vernhet; Jean-Luc Ogier; David Roy 001; Gérard Ghibaudo (Microelectron. Reliab., 2017)

Polarization switching and interface charges in BEOL compatible Ferroelectric Tunnel Junctions. - Riccardo Fontanini; Justine Barbot; Mattia Segatto; Suzanne Lancaster; Quang T. Duong; Francesco Driussi; Laurent Grenouillet; François Triozon; Jean Coignus; Thomas Mikolajick; Stefan Slesazeck; David Esseni (ESSDERC, 2021)

Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study. - Mathieu Sicre; Megan Agnew; Christel Buj; Jean Coignus; Dominique Golanski; Rémi Helleboid; Bastien Mamdy; Isobel Nicholson; Sara Pellegrini; Denis Rideau; David Roy 001; Françis Calmon (ESSDERC, 2021)

Study on the difference between ID(VG) and C(VG) pBTI shifts in GaN-on-Si E-mode MOSc-HEMT. - Aby-Gaël Viey; William Vandendaele; Marie-Anne Jaud; Jean Coignus; Jacques Cluzel; Alexis Krakovinsky; Simon Martin 006; Jérome Biscarrat; Romain Gwoziecki; Veronique Sousa; Fred Gaillard; Roberto Modica; et al. (IRPS, 2021)

Ferroelectric Tunneling Junctions for Edge Computing. - Erika Covi; Quang T. Duong; Suzanne Lancaster; Viktor Havel; Jean Coignus; Justine Barbot; Ole Richter; Philipp Klein; Elisabetta Chicca; Laurent Grenouillet; Athanasios Dimoulas; Thomas Mikolajick; et al. (ISCAS, 2021)

Interplay between charge trapping and polarization switching in MFDM stacks evidenced by frequency-dependent measurements. - Justine Barbot; Jean Coignus; Nicolas Vaxelaire; Catherine Carabasse; Olivier Glorieux; Messaoud Bedjaoui; François Aussenac; François Andrieu; François Triozon; Laurent Grenouillet (ESSCIRC, 2022)

Memory Window in Si: HfO2 FeRAM arrays: Performance Improvement and Extrapolation at Advanced Nodes. - J. Laguerre; Marc Bocquet; Olivier Billoint; Simon Martin 006; Jean Coignus; Catherine Carabasse; Thomas Magis; T. Dewolf; François Andrieu; Laurent Grenouillet (IMW, 2023)

Reliability assessment of hafnia-based ferroelectric devices and arrays for memory and AI applications (Invited). - Laurent Grenouillet; Justine Barbot; J. Laguerre; Simon Martin 006; Catherine Carabasse; M. Louro; Messaoud Bedjaoui; S. Minoret; S. Kerdilès; C. Boixaderas; Thomas Magis; Carine Jahan; et al. (IRPS, 2023)

Charge-based Sense Demonstration in 1T-1C HZO FeRAM Arrays to Overcome CBL-induced Bank Size Limitations. - Olivier Billoint; Simon Martin 006; J. Laguerre; L. Hosier; Jean Coignus; Catherine Carabasse; François Andrieu; Laurent Grenouillet (IMW, 2024)

Data Retention Insights from Joint Analysis on BEOL-Integrated HZO-Based Scaled FeCAPs and 16kbit 1T-1C FeRAM Arrays. - J. Laguerre; Simon Martin 006; Jean Coignus; Catherine Carabasse; Marc Bocquet; François Andrieu; Laurent Grenouillet (IRPS, 2024)

Polarization-Dependent Oxygen, Vacancy Distribution in Ferroelectric Hf0.5 Zr0.5 O2 Capacitors. - Gunjan Yadav; Lucía Pérez Ramírez; Nick Barrett; Jean Coignus; Nicolas Vaxelaire; Laurent Grenouillet; Jean Pascal Rueff; Denis Ceolin (NVMTS, 2024)