InP DHBT technology and design methodology for high-bit-rate optical communications circuits. - Philippe André; Jean-Louis Benchimol; Patrick Desrousseaux; Anne-Marie Duchenois; Jean Godin; Agnieszka Konczykowska; Mounir Meghelli; Muriel Riet; André Scavennec (IEEE J. Solid State Circuits, 1998)

InP HBT circuits for high speed ETDM systems. - Philippe André; Nicolas Kauffmann; Patrick Desrousseaux; Jean Godin; Agnieszka Konczykowska (ISCAS (2), 1999)

InGaAs/InP DHBT technology and design methodology for over 40 Gb/s optical communication circuits. - Philippe André; Sylvain Blayac; Philippe Berdaguer; Jean-Louis Benchimol; Jean Godin; Nicolas Kauffmann; Agnieszka Konczykowska; Abed-Elhak Kasbari; Muriel Riet (IEEE J. Solid State Circuits, 2001)

InP HBT driver circuit optimization for high-speed ETDM transmission. - Nicolas Kauffmann; Sylvain Blayac; Miloud Abboun; Philippe André; Frédéric Aniel; Muriel Riet; Jean-Louis Benchimol; Jean Godin; Agnieszka Konczykowska (IEEE J. Solid State Circuits, 2001)

40 Gbit/s transmission: III-V integrated circuits for opto-electronic interfaces. - André Scavennec; Jean Godin; René Lefevre (Ann. des Télécommunications, 2003)

1/f noise analysis of InP/InGaAs DHBTs submitted to bias and thermal stresses. - J. C. Martin; Cristell Maneux; Nathalie Labat; André Touboul; Muriel Riet; S. Blayac; M. Kahn; Jean Godin (Microelectron. Reliab., 2003)

InP DHBT Integrated Circuits for Fiber-Optic High-Speed Applications. - Jean Godin; Agnieszka Konczykowska; Muriel Riet; Jacques Moulu; Philippe Berdaguer; Filipe Jorge (IEICE Trans. Electron., 2006)

InP DHBT circuits: From device physics to 40Gb/s and 100Gb/s transmission system experiments. - Nils Weimann; Vincent Houtsma; Rose Kopf; Yves Baeyens; Joseph Weiner; Alaric Tate; John Frackoviak; Young-Kai Chen; Gregory Raybon; Jean Godin; Muriel Riet; Virginie Nodjiadjim; et al. (Bell Labs Tech. J., 2009)

Preliminary results of storage accelerated aging test on InP/InGaAs DHBT. - G. A. Koné; Brice Grandchamp; C. Hainaut; François Marc; Cristell Maneux; Nathalie Labat; Thomas Zimmer; Virginie Nodjiadjim; Jean Godin (Microelectron. Reliab., 2010)

Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design. - Sudip Ghosh 002; Brice Grandchamp; G. A. Koné; François Marc; Cristell Maneux; Thomas Zimmer; Virginie Nodjiadjim; Muriel Riet; Jean-Yves Dupuy; Jean Godin (Microelectron. Reliab., 2011)

Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses. - G. A. Koné; Brice Grandchamp; C. Hainaut; François Marc; Cristell Maneux; Nathalie Labat; Thomas Zimmer; Virginie Nodjiadjim; Muriel Riet; Jean Godin (Microelectron. Reliab., 2011)

A 40 GSamples/s InP-DHBT Track-and-Hold Amplifier with high dynamic range and large bandwidth. - Yves Bouvier; Achour Ouslimani; Agnieszka Konczykowska; Jean Godin (CSNDSP, 2012)

Advancements on reliability-aware analog circuit design. - Bertrand Ardouin; Jean-Yves Dupuy; Jean Godin; Virginie Nodjiadjim; Muriel Riet; François Marc; Gilles Amadou Koné; Sudip Ghosh 002; Brice Grandchamp; Cristell Maneux (ESSCIRC, 2012)

Transmission of 50-GHz-spaced single-carrier channels at 516Gb/s over 600km. - Oriol Bertran-Pardo; Jeremie Renaudier; Haïk Mardoyan; Patrice Tran; Rafael Rios-Müller; Agnieszka Konczykowska; Jean-Yves Dupuy; Filipe Jorge; Muriel Riet; Bernadette Duval; Jean Godin; Sebastian Randel; et al. (OFC/NFOEC, 2013)

High Speed Multi-Level Drivers for Spectrally Efficient Optical Transmission Systems. - Jean Godin; Agnieszka Konczykowska; Jean-Yves Dupuy; Muriel Riet; Virginie Nodjiadjim; Filipe Jorge; Gabriel Charlet; Oriol Bertran-Pardo; Jérémie Renaudier; Haïk Mardoyan; Alan H. Gnauck; Peter J. Winzer (Bell Labs Tech. J., 2013)