A cost-effective technique for extending the low-frequency range of a microwave noise parameter test set. - Laurent Escotte; Jean-Guy Tartarin; Jacques Graffeuil (IEEE Trans. Instrum. Meas., 1999)

Transmission quality evaluation of Tire Pressure Monitoring Systems. - Mohamed Cheikh; Jean-Guy Tartarin; Jacques David; Sébastien Kessler; Alexis Morin (ITSC, 2009)

An Empirical Study of RF Link for Wireless Automotive Passive Entry System. - Mohamed Cheikh; Sébastien Kessler; Jean-Guy Tartarin; Alexis Morin; Jacques David (VTC Spring, 2010)

Efficient Time Diversity Evaluation for Direct Tire Pressure Monitoring System. - Jean-Guy Tartarin; Mohamed Cheikh; Sébastien Kessler; Alexis Morin; Jacques David (VTC Spring, 2010)

Evidence of relationship between mechanical stress and leakage current in AlGaN/GaN transistor after storage test. - Benoit Lambert; Nathalie Labat; Dominique Carisetti; Serge Karboyan; Jean-Guy Tartarin; Jim Thorpe; Laurent Brunel; Arnaud Curutchet; Nathalie Malbert; Eddy Latu-Romain; Michel Mermoux (Microelectron. Reliab., 2012)

Influence of gate leakage current on AlGaN/GaN HEMTs evidenced by low frequency noise and pulsed electrical measurements. - S. Karboyan; Jean-Guy Tartarin; M. Rzin; Laurent Brunel; Arnaud Curutchet; Nathalie Malbert; Nathalie Labat; D. Carisetti; Benoit Lambert; M. Mermoux; E. Romain-Latu; F. Thomas; et al. (Microelectron. Reliab., 2013)

Correlation between transient evolutions of the gate and drain currents in AlGaN/GaN technologies. - O. Lazar; Jean-Guy Tartarin; Benoit Lambert; C. Moreau; J.-L. Roux (Microelectron. Reliab., 2015)

Gate defects analysis in AlGaN/GaN devices by mean of accurate extraction of the Schottky Barrier Height, electrical modelling, T-CAD simulations and TEM imaging. - Jean-Guy Tartarin; O. Lazar; D. Saugnon; Benoit Lambert; C. Moreau; C. Bouexière; E. Romain-Latu; K. Rousseau; A. David; J.-L. Roux (Microelectron. Reliab., 2017)

Thermal and statistical analysis of various AlN/GaN HEMT geometries for millimeter Wave applications. - N. Said; Kathia Harrouche; Farid Medjdoub; Nathalie Labat; Jean-Guy Tartarin; Nathalie Malbert (IRPS, 2023)