Modeling of high voltage devices for ESD event simulation in SPICE. - Yuanzhong Paul Zhou; Javier A. Salcedo; Jean-Jacques Hajjar (Microelectron. J., 2012)

Investigation on effectiveness of series gate resistor in CDM ESD protection designs. - Yuanzhong Paul Zhou; Alan W. Righter; Jean-Jacques Hajjar (ASICON, 2013)

vfTLP-VTH: A new method for quantifying the effectiveness of ESD protection for the CDM classification test. - Yuanzhong Paul Zhou; David Ellis; Jean-Jacques Hajjar; Andrew Olney; Juin J. Liou (Microelectron. Reliab., 2013)

Design optimization of SiGe BiCMOS Silicon Controlled Rectifier for Charged Device Model (CDM) protection applications. - Qiang Cui; Srivatsan Parthasarathy; Javier A. Salcedo; Juin J. Liou; Jean-Jacques Hajjar; Yuanzhong Paul Zhou (Microelectron. Reliab., 2014)

ESD protection clamp with active feedback and mis-trigger immunity in 28nm CMOS process. - Srivatsan Parthasarathy; Javier A. Salcedo; Sandro Herrera; Jean-Jacques Hajjar (IRPS, 2015)

Compact failure modeling for devices subject to electrostatic discharge stresses - A review pertinent to CMOS reliability simulation. - Meng Miao; Yuanzhong Paul Zhou; Javier A. Salcedo; Jean-Jacques Hajjar; Juin J. Liou (Microelectron. Reliab., 2015)

Design and characterization of ESD solutions with EMC robustness for automotive applications. - Yunfeng Xi; Javier A. Salcedo; Yuanzhong Paul Zhou; Juin J. Liou; Jean-Jacques Hajjar (Microelectron. Reliab., 2015)

ESD protection structure with reduced capacitance and overshoot voltage for high speed interface applications. - Aihua Dong; Javier A. Salcedo; Srivatsan Parthasarathy; Yuanzhong Paul Zhou; Sirui Luo; Jean-Jacques Hajjar; Juin J. Liou (Microelectron. Reliab., 2017)

Characterization and Modeling of the Transient Safe Operating Area in LDMOS Transistors. - Hang Li; Kalpathy B. Sundaram; Yuanzhong Paul Zhou; Javier A. Salcedo; Jean-Jacques Hajjar (IRPS, 2019)

A High Voltage Tolerant Supply Clamp for ESD Protection in a 45-nm SOI Technology. - Shudong Huang; Srivatsan Parthasarathy; Yuanzhong Paul Zhou; Jean-Jacques Hajjar; Elyse Rosenbaum (IRPS, 2022)

Optimization of SCR for High-Speed Digital and RF Applications in 45-nm SOI CMOS Technology. - Shudong Huang; Srivatsan Parthasarathy; Yuanzhong Paul Zhou; Jean-Jacques Hajjar; Elyse Rosenbaum (IRPS, 2023)

Reduced RC Time Constant High Voltage Tolerant Supply Clamp for ESD Protection in 16nm FinFET Technology. - Shudong Huang; Srivatsan Parthasarathy; Yuanzhong Paul Zhou; Jean-Jacques Hajjar; Elyse Rosenbaum (IRPS, 2024)