Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach. - Rabeb Kheriji; V. Danelon; Jean-Louis Carbonéro; Salvador Mir (DATE, 2005)

Behavioral Modeling of WCDMA Transceiver with VHDL-AMS Language. - Yves Joannon; Vincent Beroulle; Rami Khouri; Chantal Robach; Smail Tedjini; Jean-Louis Carbonéro (DDECS, 2006)

A SNDR BIST for Sigma-Delta Analogue-to-Digital Converters. - Luís Rolíndez; Salvador Mir; Ahcène Bounceur; Jean-Louis Carbonéro (VTS, 2006)

A BIST Scheme for SNDR Testing of SigmaDelta ADCs Using Sine-Wave Fitting. - Luís Rolíndez; Salvador Mir; Ahcène Bounceur; Jean-Louis Carbonéro (J. Electron. Test., 2006)

Interactive presentation: Evaluation of test measures for LNA production testing using a multinormal statistical model. - Jeanne Tongbong; Salvador Mir; Jean-Louis Carbonéro (DATE, 2007)

A stereo audio Σ∑ ADC architecture with embedded SNDR self-test. - Luís Rolíndez; Salvador Mir; Jean-Louis Carbonéro; Dimitri Goguet; Nabil Chouba (ITC, 2007)

Qualification of behavioral level design validation for AMS & RF SoCs. - Yves Joannon; Vincent Beroulle; Chantal Robach; Smail Tedjini; Jean-Louis Carbonéro (VLSI-SoC, 2007)

Decreasing Test Qualification Time in AMS and RF Systems. - Yves Joannon; Vincent Beroulle; Chantal Robach; Smail Tedjini; Jean-Louis Carbonéro (IEEE Des. Test Comput., 2008)

Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test. - Yves Joannon; Vincent Beroulle; Chantal Robach; Smail Tedjini; Jean-Louis Carbonéro (VLSI Design, 2008)

BIST scheme for RF VCOs allowing the self-correction of the cut. - Luca Testa; Hervé Lapuyade; Yann Deval; Olivier Mazouffre; Jean-Louis Carbonéro; Jean-Baptiste Bégueret (ITC, 2009)

Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak Voltage Detectors. - Luca Testa; Hervé Lapuyade; Yann Deval; Jean-Louis Carbonéro; Jean-Baptiste Bégueret (J. Electron. Test., 2010)