New qualification approach for optoelectronic components. - Jean-Luc Goudard; P. Berthier; X. Boddaert; Dominique Laffitte; J. Périnet (Microelectron. Reliab., 2002)

Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules. - Yannick Deshayes; Laurent Béchou; Jean-Yves Delétage; Frédéric Verdier; Yves Danto; Dominique Laffitte; Jean-Luc Goudard (Microelectron. Reliab., 2003)

Reliability of optoelectronics components: towards new qualification practices. - Jean-Luc Goudard; X. Boddaert; J. Périnet; Dominique Laffitte (Microelectron. Reliab., 2003)

Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator. - Laurent Mendizabal; Jean-Louis Verneuil; Laurent Béchou; Christelle Aupetit-Berthelemot; Yannick Deshayes; Frédéric Verdier; Jean-Michel Dumas; Yves Danto; Dominique Laffitte; Jean-Luc Goudard (Microelectron. Reliab., 2003)

Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests. - Laurent Mendizabal; Laurent Béchou; Yannick Deshayes; Frédéric Verdier; Yves Danto; Dominique Laffitte; Jean-Luc Goudard; F. Houé (Microelectron. Reliab., 2004)

Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier. - S. Huyghe; Laurent Béchou; Nicolas Zerounian; Yannick Deshayes; Frédéric Aniel; A. Denolle; Dominique Laffitte; Jean-Luc Goudard; Yves Danto (Microelectron. Reliab., 2005)