An EMC-Compliant Design Method of High-Density Integrated Circuits. - Jean-Luc Levant; Mohammed Ramdani (DATE, 2002)

Early Prediction of Conducted-Mode Emission of complex IC's. - Anne-Marie Trullemans-Anckaert; Richard Perdriau; Mohammed Ramdani 002; Jean-Luc Levant (FDL, 2004)

ICEM modelling of microcontroller current activity. - Jean-Luc Levant; Mohammed Ramdani 002; Richard Perdriau (Microelectron. J., 2004)

An EMC-oriented VHDL-AMS simulation methodology for dynamic current activity assessment. - Richard Perdriau; Mohammed Ramdani 002; Jean-Luc Levant; Eric Tinlot; Anne-Marie Trullemans-Anckaert (Microelectron. J., 2004)

Electromagnetic immunity model of an ADC for microcontroller's reliability improvement. - Jean-Baptiste Gros; Geneviève Duchamp; Alain Meresse; Jean-Luc Levant (Microelectron. Reliab., 2009)

Control of the electromagnetic compatibility: An issue for IC reliability. - Jean-Baptiste Gros; Geneviève Duchamp; Jean-Luc Levant; Christian Marot (Microelectron. Reliab., 2011)

Developing a universal exchange format for Integrated Circuit Emission Model - Conducted Emissions. - Abhishek Ramanujan; Etienne Sicard; Alexandre Boyer; Jean-Luc Levant; Christian Marot; Frédéric Lafon (EMC Compo, 2015)

Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements. - Ala Ayed; Tristan Dubois; Jean-Luc Levant; Geneviève Duchamp (Microelectron. Reliab., 2015)

A New Method for the Characterization of Electronic Components Immunity. - Ala Ayed; Tristan Dubois; Jean-Luc Levant; Geneviève Duchamp (IEEE Trans. Instrum. Meas., 2015)