Implementing Boundary-Scan and Pseudo-Random BIST in an Asynchronous Transfer Mode Switch. - Pierre Thorel; Jean-Luc Rainard; Alain Botta; Alain Chemarin; Jacques Majos (ITC, 1991)

A new tool for random testability evaluation using simulation and formal proof. - Emmanuel Simeu; Anura Puissochet; Jean-Luc Rainard; Anne-Marie Tagant; Michel Poize (VTS, 1992)

A high-speed CMOS circuit for 1.2-Gb/s 16*16 ATM switching. - Alain Chemarin; Alain André; Alain Botta; Jacques Majos; Jean-Luc Rainard; Henri Teyssier; Pierre Thorel (IEEE J. Solid State Circuits, 1992)

Nanofocused X-Ray Beam to Reprogram Secure Circuits. - Stéphanie Anceau; Pierre Bleuet; Jessy Clédière; Laurent Maingault; Jean-Luc Rainard; Rémi Tucoulou (CHES, 2017)

Laboratory X-rays Operando Single Bit Attacks on Flash Memory Cells. - Laurent Maingault; Stéphanie Anceau; Manuel Sulmont; Luc Salvo; Jessy Clédière; Pierre Lhuissier; Emrick Beliard; Jean-Luc Rainard (CARDIS, 2021)