High-resolution in-situ of gold electromigration: test time reduction. - Kris Croes; R. Dreesen; Jean Manca; Ward De Ceuninck; Luc De Schepper; Luc Tielemans; P. J. van der Wel (Microelectron. Reliab., 2001)

A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation. - R. Dreesen; Kris Croes; Jean Manca; Ward De Ceuninck; Luc De Schepper; A. Pergoot; Guido Groeseneken (Microelectron. Reliab., 2001)

High-resolution SILC measurements of thin SiO2 at ultra low voltages. - Stefano Aresu; Ward De Ceuninck; R. Dreesen; Kris Croes; E. Andries; Jean Manca; Luc De Schepper; Robin Degraeve; Ben Kaczer; Marc D'Olieslaeger (Microelectron. Reliab., 2002)

A new method for the analysis of high-resolution SILC data. - Stefano Aresu; Ward De Ceuninck; G. Knuyt; J. Mertens; Jean Manca; Luc De Schepper; Robin Degraeve; Ben Kaczer; Marc D'Olieslaeger; Jan D'Haen (Microelectron. Reliab., 2003)

Evidence for source side injection hot carrier effects on lateral DMOS transistors. - Stefano Aresu; Ward De Ceuninck; Geert Van den Bosch; Guido Groeseneken; Peter Moens; Jean Manca; D. Wojciechowski; P. Gassot (Microelectron. Reliab., 2004)