Reliability analysis of CMOS MEMS structures obtained by Front Side Bulk Micromachining. - M. Dardalhon; Vincent Beroulle; Laurent Latorre; Pascal Nouet; Guy Perez; Jean Marc Nicot; Coumar Oudéa (Microelectron. Reliab., 2002)

Application of MEMS behavioral simulation to Physics of Failure (PoF) modeling. - Petra Schmitt; Francis Pressecq; Xavier Lafontan; Q.-H. Duong; Patrick Pons; Jean Marc Nicot; Coumar Oudéa; Daniel Estève; Jean-Yves Fourniols; Henri Camon (Microelectron. Reliab., 2003)

Dynamic Laser Stimulation Case Studies. - Felix Beaudoin; Kevin Sanchez; Romain Desplats; Philippe Perdu; Jean Marc Nicot; J. P. Roux; M. Otte (Microelectron. Reliab., 2005)