The mirrored lateral SCR (MILSCR) as an ESD protection structure: design and optimization using 2-D device simulation. - Christelle Delage; Nicolas Nolhier; Marise Bafleur; Jean-Marie Dorkel; Jo Hamid; Philippe Givelin; Jacques Lin-Kwang (IEEE J. Solid State Circuits, 1999)

Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology. - Géraldine Bertrand; Christelle Delage; Marise Bafleur; Nicolas Nolhier; Jean-Marie Dorkel; Quang Nguyen; Nicolas Mauran; David Trémouilles; Philippe Perdu (IEEE J. Solid State Circuits, 2001)

Characterization method of thermomechanical parameters for microelectronic materials. - Oliver Perat; Jean-Marie Dorkel; Emmanuel Scheid; Pierre Temple-Boyer; Y. S. Chung; A. Peyre-Lavigne; M. Zecri; Patrick Tounsi (Microelectron. Reliab., 2002)

Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue. - B. Khong; Patrick Tounsi; Philippe Dupuy; X. Chauffleur; Marc Legros; A. Deram; Colette Levade; G. Vanderschaeve; Jean-Marie Dorkel; Jean-Pierre Fradin (Microelectron. Reliab., 2005)

Source electrode evolution of a low voltage power MOSFET under avalanche cycling. - B. Bernoux; René Escoffier; P. Jalbaud; Jean-Marie Dorkel (Microelectron. Reliab., 2009)

3D Electro-thermal modelling of bonding and metallization ageing effects for reliability improvement of power MOSFETs. - Toufik Azoui; Patrick Tounsi; Philippe Dupuy; L. Guillot; Jean-Marie Dorkel (Microelectron. Reliab., 2011)

Innovative methodology to extract dynamic compact thermal models: Application to power devices. - Toufik Azoui; Patrick Tounsi; Jean-Marie Dorkel (Microelectron. J., 2012)

Study of mechanical stress impact on the I-V characteristics of a power VDMOS device using 2D FEM simulations. - Emmanuel Marcault; Marie Breil; A. Bourennane; Patrick Tounsi; Jean-Marie Dorkel (Microelectron. Reliab., 2012)

Distributed electrothermal modeling methodology for MOS gated power devices simulations. - Emmanuel Marcault; Jean-Luc Massol; Patrick Tounsi; Jean-Marie Dorkel (MIXDES, 2013)

Estimation of power MOSFET junction temperature during avalanche mode: Experimental tests and modelling. - Toufik Azoui; Patrick Tounsi; Jean-Marie Dorkel; Jean-Michel Reynes; Jean-Luc Massol; E. Pomes (Microelectron. Reliab., 2013)