Integration of Robustness in the Design of a Cell. - Jean-Max Dutertre; F. M. Roche; Guy Cathébras (VLSI-SOC, 2001)

When Clocks Fail: On Critical Paths and Clock Faults. - Michel Agoyan; Jean-Max Dutertre; David Naccache; Bruno Robisson; Assia Tria (CARDIS, 2010)

How to flip a bit? - Michel Agoyan; Jean-Max Dutertre; Amir-Pasha Mirbaha; David Naccache; Anne-Lise Ribotta; Assia Tria (IOLTS, 2010)

Experimental Fault Injection based on the Prototyping of an AES Cryptosystem. - Jean-Baptiste Rigaud; Jean-Max Dutertre; Michel Agoyan; Bruno Robisson; Assia Tria (ReCoSoC, 2010)

A side-channel and fault-attack resistant AES circuit working on duplicated complemented values. - Marion Doulcier-Verdier; Jean-Max Dutertre; Jacques J. A. Fournier; Jean-Baptiste Rigaud; Bruno Robisson; Assia Tria (ISSCC, 2011)

Design and characterisation of an AES chip embedding countermeasures. - Jacques J. A. Fournier; Jean-Baptiste Rigaud; Sylvain Bouquet; Bruno Robisson; Assia Tria; Jean-Max Dutertre; Michel Agoyan (Int. J. Intell. Eng. Informatics, 2011)

Electromagnetic Transient Faults Injection on a Hardware and a Software Implementations of AES. - Amine Dehbaoui; Jean-Max Dutertre; Bruno Robisson; Assia Tria (FDTC, 2012)

A DFA on AES Based on the Entropy of Error Distributions. - Ronan Lashermes; Guillaume Reymond; Jean-Max Dutertre; Jacques J. A. Fournier; Bruno Robisson; Assia Tria (FDTC, 2012)

Fault Round Modification Analysis of the advanced encryption standard. - Jean-Max Dutertre; Amir-Pasha Mirbaha; David Naccache; Anne-Lise Ribotta; Assia Tria; Thierry Vaschalde (HOST, 2012)

Injection of transient faults using electromagnetic pulses -Practical results on a cryptographic system-. - Amine Dehbaoui; Jean-Max Dutertre; Bruno Robisson; P. Orsatelli; Philippe Maurine; Assia Tria (IACR Cryptol. ePrint Arch., 2012)

Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology. - Alexandre Sarafianos; Roxane Llido; Jean-Max Dutertre; Olivier Gagliano; Valerie Serradeil; Mathieu Lisart; Vincent Goubier; Assia Tria; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2012)

Electromagnetic Glitch on the AES Round Counter. - Amine Dehbaoui; Amir-Pasha Mirbaha; Nicolas Moro; Jean-Max Dutertre; Assia Tria (COSADE, 2013)

Differential analysis of Round-Reduced AES faulty ciphertexts. - Amir-Pasha Mirbaha; Jean-Max Dutertre; Assia Tria (DFTS, 2013)

Robustness improvement of an SRAM cell against laser-induced fault injection. - Alexandre Sarafianos; Mathieu Lisart; Olivier Gagliano; Valerie Serradeil; Cyril Roscian; Jean-Max Dutertre; Assia Tria (DFTS, 2013)

Fault Model Analysis of Laser-Induced Faults in SRAM Memory Cells. - Cyril Roscian; Alexandre Sarafianos; Jean-Max Dutertre; Assia Tria (FDTC, 2013)

A bulk built-in sensor for detection of fault attacks. - Rodrigo Possamai Bastos; Frank Sill Torres; Jean-Max Dutertre; Marie-Lise Flottes; Giorgio Di Natale; Bruno Rouzeyre (HOST, 2013)

Frontside laser fault injection on cryptosystems - Application to the AES' last round -. - Cyril Roscian; Jean-Max Dutertre; Assia Tria (HOST, 2013)

Power supply glitch induced faults on FPGA: An in-depth analysis of the injection mechanism. - Loïc Zussa; Jean-Max Dutertre; Jessy Clédière; Assia Tria (IOLTS, 2013)

A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults. - Rodrigo Possamai Bastos; Frank Sill Torres; Jean-Max Dutertre; Marie-Lise Flottes; Giorgio Di Natale; Bruno Rouzeyre (PATMOS, 2013)

Practical measurements of data path delays for IP authentication & integrity verification. - Ingrid Exurville; Jacques J. A. Fournier; Jean-Max Dutertre; Bruno Robisson; Assia Tria (ReCoSoC, 2013)

Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection. - Jean-Max Dutertre; Rodrigo Possamai Bastos; Olivier Potin; Marie-Lise Flottes; Bruno Rouzeyre; Giorgio Di Natale (Microelectron. Reliab., 2013)

Electrical modeling of the photoelectric effect induced by a pulsed laser applied to an SRAM cell. - Alexandre Sarafianos; Cyril Roscian; Jean-Max Dutertre; Mathieu Lisart; Assia Tria (Microelectron. Reliab., 2013)

Evidence of a Larger EM-Induced Fault Model. - Sébastien Ordas; Ludovic Guillaume-Sage; Karim Tobich; Jean-Max Dutertre; Philippe Maurine (CARDIS, 2014)

Efficiency of a glitch detector against electromagnetic fault injection. - Loïc Zussa; Amine Dehbaoui; Karim Tobich; Jean-Max Dutertre; Philippe Maurine; Ludovic Guillaume-Sage; Jessy Clédière; Assia Tria (DATE, 2014)

Laser attacks on integrated circuits: From CMOS to FD-SOI. - Jean-Max Dutertre; Stephan De Castro; Alexandre Sarafianos; Noemie Boher; Bruno Rouzeyre; Mathieu Lisart; Joel Damiens; Philippe Candelier; Marie-Lise Flottes; Giorgio Di Natale (DTIS, 2014)

Analysis of the fault injection mechanism related to negative and positive power supply glitches using an on-chip voltmeter. - Loïc Zussa; Jean-Max Dutertre; Jessy Clédière; Bruno Robisson (HOST, 2014)

Laser-Induced Fault Effects in Security-Dedicated Circuits. - Vincent Beroulle; Philippe Candelier; Stephan De Castro; Giorgio Di Natale; Jean-Max Dutertre; Marie-Lise Flottes; David Hély; Guillaume Hubert; Régis Leveugle; Feng Lu; Paolo Maistri; Athanasios Papadimitriou; et al. (VLSI-SoC (Selected Papers), 2014)

Laser-induced fault effects in security-dedicated circuits. - Régis Leveugle; Paolo Maistri; Pierre Vanhauwaert; Feng Lu; Giorgio Di Natale; Marie-Lise Flottes; Bruno Rouzeyre; Athanasios Papadimitriou; David Hély; Vincent Beroulle; Guillaume Hubert; Stephan De Castro; et al. (VLSI-SoC, 2014)

Electromagnetic analysis and fault injection onto secure circuits. - Paolo Maistri; Régis Leveugle; Lilian Bossuet; Alain Aubert; Viktor Fischer; Bruno Robisson; Nicolas Moro; Philippe Maurine; Jean-Max Dutertre; Mathieu Lisart (VLSI-SoC, 2014)

Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS. - Jean-Max Dutertre; Rodrigo Possamai Bastos; Olivier Potin; Marie-Lise Flottes; Bruno Rouzeyre; Giorgio Di Natale; Alexandre Sarafianos (Microelectron. Reliab., 2014)

Influence of triple-well technology on laser fault injection and laser sensor efficiency. - Nicolas Borrel; Clement Champeix; Edith Kussener; Wenceslas Rahajandraibe; Mathieu Lisart; Alexandre Sarafianos; Jean-Max Dutertre (DFTS, 2015)

SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology. - Clement Champeix; Nicolas Borrel; Jean-Max Dutertre; Bruno Robisson; Mathieu Lisart; Alexandre Sarafianos (DFTS, 2015)

Evidence of an information leakage between logically independent blocks. - Loïc Zussa; Ingrid Exurville; Jean-Max Dutertre; Jean-Baptiste Rigaud; Bruno Robisson; Assia Tria; Jessy Clédière (CS2@HiPEAC, 2015)

Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents. - Clement Champeix; Nicolas Borrel; Jean-Max Dutertre; Bruno Robisson; Mathieu Lisart; Alexandre Sarafianos (IOLTS, 2015)

Laser fault injection into SRAM cells: Picosecond versus nanosecond pulses. - Marc Lacruche; Nicolas Borrel; Clement Champeix; Cyril Roscian; Alexandre Sarafianos; Jean-Baptiste Rigaud; Jean-Max Dutertre; Edith Kussener (IOLTS, 2015)

Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation. - Nicolas Borrel; Clement Champeix; Mathieu Lisart; Alexandre Sarafianos; Edith Kussener; Wenceslas Rahajandraibe; Jean-Max Dutertre (IRPS, 2015)

Figure of Merits of 28nm Si Technologies for Implementing Laser Attack Resistant Security Dedicated Circuits. - Stephan De Castro; Giorgio Di Natale; Marie-Lise Flottes; Bruno Rouzeyre; Jean-Max Dutertre (ISVLSI, 2015)

Electrical model of an inverter body-biased structure in triple-well technology under pulsed photoelectric laser stimulation. - Nicolas Borrel; Clement Champeix; Edith Kussener; Wenceslas Rahajandraibe; Mathieu Lisart; Jean-Max Dutertre; Alexandre Sarafianos (Microelectron. Reliab., 2015)

On the use of Forward Body Biasing to decrease the repeatability of laser-induced faults. - Marc Lacruche; Noemie Beringuier-Boher; Jean-Max Dutertre; Jean-Baptiste Rigaud; Edith Kussener (DATE, 2016)

Body Biasing Injection Attacks in Practice. - Noemie Beringuier-Boher; Marc Lacruche; David El-Baze; Jean-Max Dutertre; Jean-Baptiste Rigaud; Philippe Maurine (CS2@HiPEAC, 2016)

Frontside Versus Backside Laser Injection: A Comparative Study. - Stephan De Castro; Jean-Max Dutertre; Bruno Rouzeyre; Giorgio Di Natale; Marie-Lise Flottes (ACM J. Emerg. Technol. Comput. Syst., 2016)

Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and Simulation. - Raphael Andreoni Camponogara Viera; Jean-Max Dutertre; Rodrigo Possamai Bastos; Philippe Maurine (DSD, 2017)

Importance of IR drops on the modeling of laser-induced transient faults. - Raphael Andreoni Camponogara Viera; Philippe Maurine; Jean-Max Dutertre; Rodrigo Possamai Bastos (SMACD, 2017)

Method for evaluation of transient-fault detection techniques. - Raphael Andreoni Camponogara Viera; Rodrigo Possamai Bastos; Jean-Max Dutertre; Philippe Maurine; Rodrigo Iga Jadue (Microelectron. Reliab., 2017)

Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model. - Jean-Max Dutertre; Vincent Beroulle; Philippe Candelier; Stephan De Castro; Louis-Barthelemy Faber; Marie-Lise Flottes; Philippe Gendrier; David Hély; Régis Leveugle; Paolo Maistri; Giorgio Di Natale; Athanasios Papadimitriou; et al. (FDTC, 2018)

The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks. - Jean-Max Dutertre; Vincent Beroulle; Philippe Candelier; Louis-Barthelemy Faber; Marie-Lise Flottes; Philippe Gendrier; David Hély; Régis Leveugle; Paolo Maistri; Giorgio Di Natale; Athanasios Papadimitriou; Bruno Rouzeyre (IOLTS, 2018)

Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits. - Raphael Andreoni Camponogara Viera; Jean-Max Dutertre; Philippe Maurine; Rodrigo Possamai Bastos (ISPD, 2018)

Laser-induced Single-bit Faults in Flash Memory: Instructions Corruption on a 32-bit Microcontroller. - Brice Colombier; Alexandre Menu; Jean-Max Dutertre; Pierre-Alain Moëllic; Jean-Baptiste Rigaud; Jean-Luc Danger (IACR Cryptol. ePrint Arch., 2018)

Assessing body built-in current sensors for detection of multiple transient faults. - Raphael Andreoni Camponogara Viera; Jean-Max Dutertre; Marie-Lise Flottes; Olivier Potin; Giorgio Di Natale; Bruno Rouzeyre; Rodrigo Possamai Bastos (Microelectron. Reliab., 2018)

Remote Side-Channel Attacks on Heterogeneous SoC. - Joseph Gravellier; Jean-Max Dutertre; Yannick Teglia; Philippe Loubet-Moundi; Francis Olivier (CARDIS, 2019)

Impact of Low-Bitwidth Quantization on the Adversarial Robustness for Embedded Neural Networks. - Rémi Bernhard; Pierre-Alain Moëllic; Jean-Max Dutertre (CW, 2019)

Precise Spatio-Temporal Electromagnetic Fault Injections on Data Transfers. - Alexandre Menu; Shivam Bhasin; Jean-Max Dutertre; Jean-Baptiste Rigaud; Jean-Luc Danger (FDTC, 2019)

Dual Detection of Heating and Photocurrent attacks (DDHP) Sensor using Hybrid CMOS/STT-MRAM. - Mounia Kharbouche-Harrari; Romain Wacquez; Gregory di Pendina; Jean-Max Dutertre; Jérémy Postel-Pellerin; Driss Aboulkassimi; Jean-Michel Portal (IOLTS, 2019)

Experimental Analysis of the Laser-Induced Instruction Skip Fault Model. - Jean-Max Dutertre; Timothée Riom; Olivier Potin; Jean-Baptiste Rigaud (NordSec, 2019)

High-Speed Ring Oscillator based Sensors for Remote Side-Channel Attacks on FPGAs. - Joseph Gravellier; Jean-Max Dutertre; Yannick Teglia; Philippe Loubet-Moundi (ReConFig, 2019)

Experimental Analysis of the Electromagnetic Instruction Skip Fault Model. - Alexandre Menu; Jean-Max Dutertre; Olivier Potin; Jean-Baptiste Rigaud; Jean-Luc Danger (DTIS, 2020)

Single-bit Laser Fault Model in NOR Flash Memories: Analysis and Exploitation. - Alexandre Menu; Jean-Max Dutertre; Jean-Baptiste Rigaud; Brice Colombier; Pierre-Alain Moëllic; Jean-Luc Danger (FDTC, 2020)

Evidence of a Dynamic Fault Model in the DICE Radiation-Hardened Cell. - William Souza da Cruz; Jean-Max Dutertre; Jean-Baptiste Rigaud; Guillaume Hubert (SBCCI, 2020)

Electromagnetic Fault Injection as a New Forensic Approach for SoCs. - Clément Gaine; Driss Aboulkassimi; Simon Pontié; Jean-Pierre Nikolovski; Jean-Max Dutertre (WIFS, 2020)

Luring of Adversarial Perturbations. - Rémi Bernhard; Pierre-Alain Moëllic; Jean-Max Dutertre (CoRR, 2020)

SideLine: How Delay-Lines (May) Leak Secrets from your SoC. - Joseph Gravellier; Jean-Max Dutertre; Yannick Teglia; Philippe Loubet-Moundi (IACR Cryptol. ePrint Arch., 2020)

Simulation and Experimental Demonstration of the Importance of IR-Drops During Laser Fault Injection. - Raphael Andreoni Camponogara Viera; Philippe Maurine; Jean-Max Dutertre; Rodrigo Possamai Bastos (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020)

Further Analysis of Laser-induced IR-drop. - William Souza da Cruz; Raphael Andreoni Camponogara Viera; Jean-Max Dutertre; Jean-Baptiste Rigaud; Guillaume Hubert (ATS, 2021)

Analysis of a Laser-induced Instructions Replay Fault Model in a 32-bit Microcontroller. - Vanthanh Khuat; Jean-Max Dutertre; Jean-Luc Danger (DSD, 2021)

Laser Fault Injection in a 32-bit Microcontroller: from the Flash Interface to the Execution Pipeline. - Vanthanh Khuat; Jean-Luc Danger; Jean-Max Dutertre (FDTC, 2021)

FaultLine: Software-Based Fault Injection on Memory Transfers. - Joseph Gravellier; Jean-Max Dutertre; Yannick Teglia; Philippe Loubet-Moundi (HOST, 2021)

Luring Transferable Adversarial Perturbations for Deep Neural Networks. - Rémi Bernhard; Pierre-Alain Moëllic; Jean-Max Dutertre (IJCNN, 2021)

Permanent Laser Fault Injection into the Flash Memory of a Microcontroller. - Raphael Andreoni Camponogara Viera; Jean-Max Dutertre; Mathieu Dumont; Pierre-Alain Moëllic (NEWCAS, 2021)

An Overview of Laser Injection against Embedded Neural Network Models. - Mathieu Dumont; Pierre-Alain Moëllic; Raphael Andreoni Camponogara Viera; Jean-Max Dutertre; Rémi Bernhard (WF-IoT, 2021)

Injecting Permanent Faults into the Flash Memory of a Microcontroller with Laser Illumination During Read Operations. - Raphael Viera 001; Jean-Max Dutertre; Rodrigo Silva Lima (ASHES@CCS, 2022)

A CFI Verification System based on the RISC-V Instruction Trace Encoder. - Anthony Zgheib; Olivier Potin; Jean-Baptiste Rigaud; Jean-Max Dutertre (DSD, 2022)

Detecting Laser Fault Injection Attacks via Time-to-Digital Converter Sensors. - Mohammad Ebrahimabadi; Suhee Sanjana Mehjabin; Raphael Viera 001; Sylvain Guilley; Jean-Luc Danger; Jean-Max Dutertre; Naghmeh Karimi (HOST, 2022)

CMOS/STT-MRAM Based Ascon LWC: a Power Efficient Hardware Implementation. - Nathan Roussel; Olivier Potin; Gregory di Pendina; Jean-Max Dutertre; Jean-Baptiste Rigaud (ICECS 2022, 2022)

An Experimentally Tuned Compact Electrical Model for Laser Fault Injection Simulation. - William Souza da Cruz; Raphael Viera 001; Jean-Baptiste Rigaud; Guillaume Hubert; Jean-Max Dutertre (IOLTS, 2022)

A Closer Look at Evaluating the Bit-Flip Attack Against Deep Neural Networks. - Kevin Hector; Pierre-Alain Moëllic; Mathieu Dumont; Jean-Max Dutertre (IOLTS, 2022)

Photonic power firewalls. - Jean-Max Dutertre; Amir-Pasha Mirbaha; David Naccache; Assia Tria (J. Cryptogr. Eng., 2022)

A CCFI Verification Scheme Based on the RISC-V Trace Encoder. - Anthony Zgheib; Olivier Potin; Jean-Baptiste Rigaud; Jean-Max Dutertre (COSADE, 2023)

Highlighting Two EM Fault Models While Analyzing a Digital Sensor Limitations. - Roukoz Nabhan; Jean-Max Dutertre; Jean-Baptiste Rigaud; Jean-Luc Danger; Laurent Sauvage (DATE, 2023)

Security Evaluation of a Hybrid CMOS/MRAM Ascon Hardware Implementation. - Nathan Roussel; Olivier Potin; Jean-Max Dutertre; Jean-Baptiste Rigaud (DATE, 2023)

Software-Only Control-Flow Integrity Against Fault Injection Attacks. - François Bonnal; Vincent Dupaquis; Olivier Potin; Jean-Max Dutertre (DSD, 2023)

Fault Injection on Embedded Neural Networks: Impact of a Single Instruction Skip. - Clément Gaine; Pierre-Alain Moëllic; Olivier Potin; Jean-Max Dutertre (DSD, 2023)

Fault Injection and Safe-Error Attack for Extraction of Embedded Neural Network Models. - Kevin Hector; Pierre-Alain Moëllic; Jean-Max Dutertre; Mathieu Dumont (ESORICS Workshops (2), 2023)

A Tale of Two Models: Discussing the Timing and Sampling EM Fault Injection Models. - Roukoz Nabhan; Jean-Max Dutertre; Jean-Baptiste Rigaud; Jean-Luc Danger; Laurent Sauvage (FDTC, 2023)

Lightweight Countermeasures Against Original Linear Code Extraction Attacks on a RISC-V Core. - Théophile Gousselot; Olivier Thomas; Jean-Max Dutertre; Olivier Potin; Jean-Baptiste Rigaud (HOST, 2023)

CIFER: Code Integrity and control Flow verification for programs Executed on a RISC-V core. - Anthony Zgheib; Olivier Potin; Jean-Baptiste Rigaud; Jean-Max Dutertre (HOST, 2023)

Evaluation of Parameter-Based Attacks Against Embedded Neural Networks with Laser Injection. - Mathieu Dumont; Kevin Hector; Pierre-Alain Moëllic; Jean-Max Dutertre; Simon Pontié (SAFECOMP, 2023)

Experimental EMFI detection on a RISC-V core using the Trace Verifier solution. - Anthony Zgheib; Olivier Potin; Jean-Baptiste Rigaud; Jean-Max Dutertre (Microprocess. Microsystems, 2023)

Active Shielding Against Physical Attacks by Observation and Fault Injection: ChaXa. - Clément Gaine; Jean-Pierre Nikolovski; Driss Aboulkassimi; Jean-Max Dutertre (J. Hardw. Syst. Secur., 2023)

When Data Shines - Leaking Data from Microcontrollers Through Photon Emission Analysis. - Rodrigo Silva Lima; Raphael Viera 001; Jean-Max Dutertre; William Magrini; Matthieu Pommies; Anthony Bertrand (ASHES@CCS, 2024)

Analysis and Mitigation of Hybrid CMOS/MRAM DFF Vulnerabilities to Laser Fault Injection. - Raphaël Comps; Jean-Baptiste Rigaud; Jean-Max Dutertre (AsianHOST, 2024)

EM Fault Injection-Induced Clock Glitches: From Mechanism Analysis to Novel Sensor Design. - Roukoz Nabhan; Jean-Max Dutertre; Jean-Baptiste Rigaud; Jean-Luc Danger; Laurent Sauvage (IOLTS, 2024)

Switching Off your Device Does Not Protect Against Fault Attacks. - Paul Grandamme; Pierre-Antoine Tissot; Lilian Bossuet; Jean-Max Dutertre; Brice Colombier; Vincent Grosso (IACR Trans. Cryptogr. Hardw. Embed. Syst., 2024)

DELFINES: Detecting Laser Fault Injection Attacks via Digital Sensors. - Mohammad Ebrahimabadi; Suhee Sanjana Mehjabin; Raphael Viera 001; Sylvain Guilley; Jean-Luc Danger; Jean-Max Dutertre; Naghmeh Karimi (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2024)

Tampering with the flash memory of microcontrollers: permanent fault injection via laser illumination during read operations. - Raphael Viera 001; Jean-Max Dutertre; Rodrigo Silva Lima; Matthieu Pommies; Anthony Bertrand (J. Cryptogr. Eng., 2024)

Multi-Sensor Data Fusion for Enhanced Detection of Laser Fault Injection Attacks in Cryptographic Hardware: Practical Results. - Mohammad Ebrahimabadi; Raphael Viera 001; Sylvain Guilley; Jean-Luc Danger; Jean-Max Dutertre; Naghmeh Karimi (DATE, 2025)

Code Encryption for Confidentiality and Execution Integrity Down to Control Signals. - Théophile Gousselot; Jean-Max Dutertre; Olivier Potin; Jean-Baptiste Rigaud (HOST, 2025)

Betrayed by Light: How Photon Emission Microscopy Empowers Register Bit-Level Laser Attacks on Microcontrollers. - Hugo Perrin; Jean-Max Dutertre; Jean-Baptiste Rigaud (HOST, 2025)