Correlation between X-ray micro-diffraction and a developed analytical model to measure the residual stresses in suspended structures in MEMS. - Sebastien Rigo; Phillippe Goudeau; Jean-Michel Desmarres; Talal Masri; Jacques-Alain Petit; Petra Schmitt (Microelectron. Reliab., 2003)

Micro-tensile tests on micromachined metal on polymer specimens: elasticity, plasticity and rupture - C. Seguineau; Michel Ignat; Christophe Malhaire; Sebastiano Brida; Xavier Lafontan; Jean-Michel Desmarres; Charles Josserond; Laurent Debove (CoRR, 2008)