EEPROM programming study-time and degradation aspects. - Pierre Canet; Rachid Bouchakour; Nadia Harabech; Philippe Boivin; Jean-Michel Mirabel (ISCAS (4), 2001)

Decreasing EEPROM Programming Bias With Negative Voltage, Reliability Impact. - Romain Laffont; J. Razafindramora; Pierre Canet; Rachid Bouchakour; Jean-Michel Mirabel (MTDT, 2002)