Overall thermal simulation of electronic equipment. - Jean-Louis Blanchard; Jean-Michel Morelle (EURO-DAC, 1994)

Experimental and numerical results correlation during extreme use of power MOSFET designed for avalanche functional mode. - Laurent Dupont 002; J. L. Blanchard; Richard Lallemand; Gerard Coquery; Jean-Michel Morelle; G. Blondel; B. Rouleau (Microelectron. Reliab., 2010)