Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. - G. Andriamonje; Vincent Pouget; Yves Ousten; Dean Lewis; Yves Danto; Jean-Michel Rampnoux; Younès Ezzahri; Stefan Dilhaire; Stéphane Grauby; Wilfrid Claeys (Microelectron. Reliab., 2003)

Applications of temperature phase measurements to IC testing. - Josep Altet; Jean-Michel Rampnoux; Jean-Christophe Batsale; Stefan Dilhaire; Antonio Rubio 001; Wilfrid Claeys; Stéphane Grauby (Microelectron. Reliab., 2004)

Time gating imaging through thick silicon substrate: a new step towards backside characterisation. - Jean-Michel Rampnoux; H. Michel; M. Amine Salhi; Stéphane Grauby; Wilfrid Claeys; Stefan Dilhaire (Microelectron. Reliab., 2006)

Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. - Eduardo Aldrete-Vidrio; M. Amine Salhi; Josep Altet; Stéphane Grauby; Diego Mateo; H. Michel; L. Clerjaud; Jean-Michel Rampnoux; Antonio Rubio 001; Wilfrid Claeys; Stefan Dilhaire (ETS, 2008)

Joule expansion imaging techniques on microlectronic devices. - Stéphane Grauby; Luis David Patiño Lopez; M. Amine Salhi; Etienne Puyoo; Jean-Michel Rampnoux; Wilfrid Claeys; Stefan Dilhaire (Microelectron. J., 2009)