Plasma Antenna Charging in CMOS Image Sensors. - Yolène Sacchettini; Jean-Pierre Carrère; Vincent Goiffon; Pierre Magnan (IRPS, 2019)

CMOS Image Sensors and Plasma Processes: How PMD Nitride Charging Acts on the Dark Current. - Yolène Sacchettini; Jean-Pierre Carrère; Romain Duru; Jean-Pierre Oddou; Vincent Goiffon; Pierre Magnan (Sensors, 2019)

Quantum efficiency of backside-illuminated pixels under ultraviolet illumination: ARC coatings impact measurements and simulations. - Nour Fassi; Jean-Pierre Carrère; Pierre Magnan; Magali Estribeau; Vincent Goiffon (Imaging Sensors and Systems, 2023)

Effect of Metallic Ion Implantation on Dark Current Distributions of Silicon-Based CMOS Image Sensors. - Juan Esteban Montoya Cardona; Sylvain Joblot; Pierre Kermagoret; Grégoire Ducotey; Stéphane Hardillier; Guillaume Dupeux; Yannick Borde; Jean-Pierre Carrère; Sandrine Lhostis; Richard Monflier; Olivier Marcelot; Vincent Goiffon (IEEE SENSORS, 2024)