Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations. - Jean-Yves Delétage; F. J.-M. Verdier; Bernard Plano; Yannick Deshayes; Laurent Béchou; Yves Danto (Microelectron. Reliab., 2003)

Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules. - Yannick Deshayes; Laurent Béchou; Jean-Yves Delétage; Frédéric Verdier; Yves Danto; Dominique Laffitte; Jean-Luc Goudard (Microelectron. Reliab., 2003)

Moisture diffusion in BCB resins used for MEMS packaging. - Angie Tetelin; Claude Pellet; Jean-Yves Delétage; B. Carbonne; Yves Danto (Microelectron. Reliab., 2003)

How to study delamination in plastic encapsulated devices. - Hélène Frémont; Jean-Yves Delétage; Kirsten Weide-Zaage; Yves Danto (Microelectron. Reliab., 2004)

Uni-axial mechanical stress effect on Trench Punch through IGBT under short-circuit operation. - Yassine Belmehdi; Stephane Azzopardi; A. Benmansour; Jean-Yves Delétage; Eric Woirgard (Microelectron. Reliab., 2009)

Experimental electro-mechanical static characterization of IGBT bare die under controlled temperature. - Yassine Belmehdi; Stephane Azzopardi; Jean-Yves Delétage; Eric Woirgard (Microelectron. Reliab., 2010)

Contribution of calendar ageing modes in the performances degradation of supercapacitors during power cycling. - Olivier Briat; Jean-Michel Vinassa; Nicolas Bertrand; H. El Brouji; Jean-Yves Delétage; Eric Woirgard (Microelectron. Reliab., 2010)

How supercapacitors reach end of life criteria during calendar life and power cycling tests. - Ramzi Chaari; Olivier Briat; Jean-Yves Delétage; Eric Woirgard; Jean-Michel Vinassa (Microelectron. Reliab., 2011)

Ageing monitoring of lithium-ion cell during power cycling tests. - Akram Eddahech; Olivier Briat; Hervé Henry; Jean-Yves Delétage; Eric Woirgard; Jean-Michel Vinassa (Microelectron. Reliab., 2011)

A preliminary study on the thermal and mechanical performances of sintered nano-scale silver die-attach technology depending on the substrate metallization. - François Le Henaff; Stephane Azzopardi; Jean-Yves Delétage; Eric Woirgard; Serge Bontemps; Julien Joguet (Microelectron. Reliab., 2012)

Electrical characterization under mechanical stress at various temperatures of PiN power diodes in a health monitoring approach. - F. Baccar; Stephane Azzopardi; L. Théolier; K. El Boubkari; Jean-Yves Delétage; Eric Woirgard (Microelectron. Reliab., 2013)

Conductive adhesive joint for extreme temperature applications. - J. B. Jullien; Hélène Frémont; Jean-Yves Delétage (Microelectron. Reliab., 2013)

Power electronic assemblies: Thermo-mechanical degradations of gold-tin solder for attaching devices. - Faical Arabi; Loic Théolier; Donatien Martineau; Jean-Yves Delétage; M. Medina; Eric Woirgard (Microelectron. Reliab., 2016)

Chemical rate phenomenon approach applied to lithium battery capacity fade estimation. - Issam Baghdadi; Olivier Briat; Jean-Yves Delétage; Philippe Gyan; Jean-Michel Vinassa (Microelectron. Reliab., 2016)

Effects of salt spray test on lead-free solder alloy. - Alexandrine Guédon-Gracia; Hélène Frémont; Bernard Plano; Jean-Yves Delétage; Kirsten Weide-Zaage (Microelectron. Reliab., 2016)

Performance quantification of latest generation Li-ion batteries in wide temperature range. - Yuan Ci Zhang; Olivier Briat; Jean-Yves Delétage; Cyril Martin; Guillaume Gager; Jean-Michel Vinassa (IECON, 2017)

Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach. - S. Hairoud-Airieau; Geneviève Duchamp; Tristan Dubois; Jean-Yves Delétage; André Durier; Hélène Frémont (Microelectron. Reliab., 2017)

Characterization of external pressure effects on lithium-ion pouch cell. - Yuan Ci Zhang; Olivier Briat; Jean-Yves Delétage; Cyril Martin; Guillaume Gager; Jean-Michel Vinassa (ICIT, 2018)

Temperature and voltage effects on HTRB and HTGB stresses for AlGaN/GaN HEMTs. - Omar Chihani; Loic Théolier; Jean-Yves Delétage; Eric Woirgard; Alain Bensoussan 002; André Durier (IRPS, 2018)

Sequential combined thermal cycling and vibration test and simulation of printed circuit board. - Faical Arabi; Alexandrine Guédon-Gracia; Jean-Yves Delétage; Hélène Frémont (Microelectron. Reliab., 2018)

Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stresses. - Omar Chihani; L. Théolier; Alain Bensoussan 002; Jean-Yves Delétage; André Durier; Eric Woirgard (Microelectron. Reliab., 2018)

Creep measurement and choice of creep laws for BGA assemblies' reliability simulation. - S. Pin; Alexandrine Guédon-Gracia; Jean-Yves Delétage; Hélène Frémont (Microelectron. Reliab., 2018)

Efficient state of health estimation of Li-ion battery under several ageing types for aeronautic applications. - Yuan Ci Zhang; Olivier Briat; Jean-Yves Delétage; Cyril Martin; Nicolas Chadourne; Jean-Michel Vinassa (Microelectron. Reliab., 2018)