DFM/DFY design for manufacturability and yield - influence of process variations in digital, analog and mixed-signal circuit design. - Markus Bühler; Jürgen Koehl; Jeanne Bickford; Jason Hibbeler; Ulf Schlichtmann; Ralf Sommer; Michael Pronath; Andreas Ripp (DATE, 2006)

Yield Improvement by Local Wiring Redundancy. - Jeanne Bickford; Jason Hibbeler; Markus Bühler; Jürgen Koehl; Dirk Müller 003; Sven Peyer; Christian Schulte 002 (ISQED, 2006)

Use of scalable Parametric Measurement Macro to improve semiconductor technology characterization and product test. - Jeanne Bickford; Nazmul Habib; John Goss; Robert McMahon; Rajiv V. Joshi; Rouwaida Kanj (ISQED, 2010)