ASIC Test Cost/Strategy Trade-offs. - Donald L. Wheater; Phil Nigh; Jeanne Trinko Mechler; Luke Lacroix (ITC, 1994)

In-system failure investigation on 0.18 μm high speed serial link ASIC using logic built-in self test. - Jeanne Trinko Mechler; Raymond J. Bulaga; Jon Garlett (CICC, 2003)

Behavioral modeling and simulation. - Jeanne Trinko Mechler; Larry Nagel (CICC, 2005)

Session 8 - Characterization and test methods for device variability in nanoscale technologies. - Hamid Mahmoodi; Jeanne Trinko Mechler (CICC, 2008)