A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing. - Gyusung Park; Minsu Kim; Nakul Pande; Po-Wei Chiu; Jeehwan Song; Chris H. Kim (CICC, 2019)

Reliability Characterization of Logic-Compatible NAND Flash Memory based Synapses with 3-bit per Cell Weights and 1μA Current Steps. - Minsu Kim; Jeehwan Song; Chris H. Kim (IRPS, 2020)