The Influence of Input and Output Measurement Noise on Batch-End Quality Prediction with Partial Least Squares. - Jef Vanlaer; Pieter Van den Kerkhof; Geert Gins; Jan F. M. Van Impe (ICDM, 2012)

Dynamic model-based fault diagnosis for (bio)chemical batch processes. - Pieter Van den Kerkhof; Geert Gins; Jef Vanlaer; Jan F. M. Van Impe (Comput. Chem. Eng., 2012)

Contribution plots for Statistical Process Control: Analysis of the smearing-out effect. - Pieter Van den Kerkhof; Jef Vanlaer; Geert Gins; Jan F. M. Van Impe (ECC, 2013)

Extending Statistical Models for Batch-End Quality Prediction to Batch Control. - Geert Gins; Jef Vanlaer; Pieter Van den Kerkhof; Jan F. M. Van Impe (ICDM, 2013)

Quality assessment of a variance estimator for Partial Least Squares prediction of batch-end quality. - Jef Vanlaer; Geert Gins; Jan F. M. Van Impe (Comput. Chem. Eng., 2013)

The RAYMOND simulation package - Generating RAYpresentative MONitoring Data to design advanced process monitoring and control algorithms. - Geert Gins; Jef Vanlaer; Pieter Van den Kerkhof; Jan F. M. Van Impe (Comput. Chem. Eng., 2014)