Monte Carlo Simulations of Impact Ionization Feedback in MOSFET Structures. - Jeff Bude (VLSI Design, 1998)

Invited Paper: Extending Resolution Limits of IC Fabrication Technology: Demonstration by Device Fabrication and Circuit Performance. - Omkaram Nalamasu; Pat G. Watson; Raymond A. Cirelli; Jeff Bude; Isik C. Kizilyalli; Ross A. Kohler (VLSI Design, 2001)

Substrate Bias Effect on Cycling Induced Performance Degradation of Flash EEPROMs. - S. Mahapatra; S. Shukuri; Jeff Bude (VLSI Design, 2003)