Using Volume Cell-aware Diagnosis Results to Improve Physical Failure Analysis Efficiency. - Hanson Peng; Mao-Yuan Hsia; Man-Ting Pang; I.-Y. Chang; Jeff Fan; Huaxing Tang; Manish Sharma; Wu Yang (ITC, 2020)

Affordable and Comprehensive Testing of 3-D Stacked Die Devices. - Jean-François Côté; Jeff Fan; Sean Shen; Givargis Danialy 001; Marcin Lipinski; Michael Garbers; Wu Yang; Martin Keim; Andreas Glowatz; Joe Reynick; Ayush Patel; Joanna Michna (IEEE Des. Test, 2022)