Test cost reduction for the AMD™ Athlon processor using test partitioning. - Anuja Sehgal; Jeff Fitzgerald; Jeff Rearick (ITC, 2007)

Test Data Volume Comparison: Monolithic vs. Modular SoC Testing. - Ozgur Sinanoglu; Erik Jan Marinissen; Anuja Sehgal; Jeff Fitzgerald; Jeff Rearick (IEEE Des. Test Comput., 2009)

The scan-DFT features of AMD's next-generation microprocessor core. - Mahmut Yilmaz; Baosheng Wang; Jayalakshmi Rajaraman; Tom Olsen; Kanwaldeep Sobti; Dwight Elvey; Jeff Fitzgerald; Grady Giles; Wei-Yu Chen (ITC, 2010)