eNVM MRAM Retention Reliability Modeling in 22FFL FinFET Technology. - James A. O'Donnell; Chris Connor; Tanmoy Pramanik; Jeff Hicks; Juan G. Alzate; Fatih Hamzaoglu; Justin Brockman; Oleg Golonzka; Kevin Fischer (IRPS, 2019)

eNVM RRAM reliability performance and modeling in 22FFL FinFET technology. - Yao-Feng Chang; James A. O'Donnell; Tony Acosta; Roza Kotlyar; Albert B. Chen; Pedro A. Quintero; Nathan Strutt; Oleg Golonzka; Chris Connor; Jeff Hicks (IRPS, 2020)

Modeling Framework for Transistor Aging Playback in Advanced Technology Nodes. - Inanc Meric; Stephen Ramey; Steven R. Novak; S. Gupta; S. P. Mudanai; Jeffrey Hicks (IRPS, 2020)

Embedded emerging memory technologies for neuromorphic computing: temperature instability and reliability. - Yao-Feng Chang; Ilya Karpov; Reed Hopkins; David Janosky; Jacob Medeiros; Benjamin Sherrill; Jiahan Zhang; Yifu Huang; Tanmoy Pramanik; Albert B. Chen; Tony Acosta; Abdullah Guler; et al. (IRPS, 2021)

Localized thermal effects in Gate-all-around devices. - Colin Landon; Lei Jiang; Daniel Pantuso; Inanc Meric; Kam Komeyli; Jeffrey Hicks; Daniel Schroeder (IRPS, 2023)