Polysilicon resistor stability under voltage stress for safe-operating area characterization. - Chris Kendrick; Michael Cook 004; Jeff P. Gambino; T. Myers; J. Slezak; T. Hirano; T. Sano; Y. Watanabe; K. Ozeki (IRPS, 2018)

Effect of Residual TiN on Reliability of Au Wire Bonds during High Temperature Storage. - John M. McGlone; Guy Brizar; Daniel Vanderstraeten; Dorai Iyer; Sallie Hose; Jeff P. Gambino (IRPS, 2020)

Dielectric Relaxation, Aging and Recovery in High-K MIM Capacitors. - Konner E. K. Holden; Gavin D. R. Hall; Michael Cook 004; Chris Kendrick; Kaitlyn Pabst; Bruce Greenwood; Robin Daugherty; Jeff P. Gambino; Derryl D. J. Allman (IRPS, 2021)

Assessing SiCr resistor drift for automotive analog ICs. - Kevin A. Stewart; Keiichi Kimura; Matt Ring; Koen Noldus; Pat Hulse; Rick C. Jerome; Akihiro Hasegawa; Jeff P. Gambino; David T. Price (IRPS, 2021)