Group Testing for Video Compression. - Gidon Shavit; Michael F. Ringenburg; Jeff West; Richard E. Ladner; Eve A. Riskin (Data Compression Conference, 2004)

High voltage time-dependent dielectric breakdown in stacked intermetal dielectrics. - SangHoon Shin; Yen-Pu Chen; Woojin Ahn; Honglin Guo; Byron Williams; Jeff West; Tom Bonifield; Dhanoop Varghese; Srikanth Krishnan; Muhammad Ashraful Alam (IRPS, 2018)

High Frequency TDDB of Reinforced Isolation Dielectric Systems. - Tom Bonifield; Honglin Guo; Jeff West; Hisashi Shichijo; Talha Tahir (IRPS, 2020)