Application of Scanning Capacitance Microscopy on SOI device with wafer edge low yield pattern. - Changqing Chen; Ghim Boon Ang; Peng Tiong Ng; Francis Rivai; Soh Ping Neo; Dayanand Nagalingam; Kim Hong Yip; Jeffery Lam; Zhihong Mai (Microelectron. Reliab., 2017)

Embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis. - Changqing Chen; Ghim Boon Ang; Peng Tiong Ng; Francis Rivai; Hui Peng Ng; Alfred C. T. Quah; Angela Teo; Jeffery Lam; Zhihong Mai (Microelectron. Reliab., 2017)