Benefits of Phase Interference Detection to IC Waveform Probing. - Jeffrey A. Block; William K. Lo; Chris Shaw (Asian Test Symposium, 2001)

Foundry workflow for dynamic-EFA-based yield ramp. - Cathy Kardach; I. Kapilevich; Jeffrey A. Block; Ted R. Lundquist; Steven Kasapi; J. Liao; Yin S. Ng; Bruce Cory (Microelectron. Reliab., 2011)