Test chips for die stress characterization using arrays of CMOS sensors. - Arthur T. Bradley; Richard C. Jaeger; Jeffrey C. Suhling; Y. Zou (CICC, 1999)

CMOS stress sensors on [100] silicon. - Richard C. Jaeger; Jeffrey C. Suhling; Ramanathan Ramani; Arthur T. Bradley; Jianping Xu (IEEE J. Solid State Circuits, 2000)

Feature extraction and damage-precursors for prognostication of lead-free electronics. - Pradeep Lall; Madhura Hande; Chandan Bhat; Nokibul Islam; Jeff Suhling; Jay Lee (Microelectron. Reliab., 2007)

Current dependence of the piezoresistive coefficients of CMOS FETs on (100) silicon. - Safina Hussain; Richard C. Jaeger; Jeffrey C. Suhling (ESSDERC, 2014)

Experimental determination of fatigue behavior of lead free solder joints in microelectronic packaging subjected to isothermal aging. - Muhannad Mustafa; Jeffrey C. Suhling; Pradeep Lall (Microelectron. Reliab., 2016)

First and Second Order Piezoresistive Characteristics of CMOS FETs: Weak through Strong Inversion. - Richard C. Jaeger; Jeffrey C. Suhling (ESSDERC, 2018)