Debugging Optimized Code: Concepts and Implementation on DIGITAL Alpha Systems. - Ronald F. Brender; Jeffrey E. Nelson; Mark E. Arsenault (Digit. Tech. J., 1998)

Schedulers as model-based design elements in programmable heterogeneous multiprocessors. - JoAnn M. Paul; Alex Bobrek; Jeffrey E. Nelson; Joshua J. Pieper; Donald E. Thomas (DAC, 2003)

Modeling Shared Resource Contention Using a Hybrid Simulation/Analytical Approach. - Alex Bobrek; Joshua J. Pieper; Jeffrey E. Nelson; JoAnn M. Paul; Donald E. Thomas (DATE, 2004)

Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. - Thomas J. Vogels; Thomas Zanon; Rao Desineni; R. D. (Shawn) Blanton; Wojciech Maly; Jason G. Brown; Jeffrey E. Nelson; Y. Fei; X. Huang; Padmini Gopalakrishnan; Mahim Mishra; Vyacheslav Rovner; et al. (ITC, 2004)

Power-Performance Simulation and Design Strategies for Single-Chip Heterogeneous Multiprocessors. - Brett H. Meyer; Joshua J. Pieper; JoAnn M. Paul; Jeffrey E. Nelson; Sean M. Pieper; Anthony G. Rowe (IEEE Trans. Computers, 2005)

Multiple-detect ATPG based on physical neighborhoods. - Jeffrey E. Nelson; Jason G. Brown; Rao Desineni; R. D. (Shawn) Blanton (DAC, 2006)

Extraction of defect density and size distributions from wafer sort test results. - Jeffrey E. Nelson; Thomas Zanon; Rao Desineni; Jason G. Brown; N. Patil; Wojciech Maly; R. D. (Shawn) Blanton (DATE, 2006)

Extracting Defect Density and Size Distributions from Product ICs. - Jeffrey E. Nelson; Thomas Zanon; Jason G. Brown; Osei Poku; R. D. (Shawn) Blanton; Wojciech Maly; Brady Benware; Chris Schuermyer (IEEE Des. Test Comput., 2006)

Automatic classification of bridge defects. - Jeffrey E. Nelson; Wing Chiu Tam; Ronald D. Blanton (ITC, 2010)

Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations. - R. D. (Shawn) Blanton; Wing Chiu Tam; Xiaochun Yu; Jeffrey E. Nelson; Osei Poku (IEEE Des. Test Comput., 2012)