Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology. - Taiki Uemura; Byungjin Chung; Jegon Kim; Hyewon Shim; Shin-Young Chung; Brandon Lee; Jaehee Choi; Shota Ohnishi; Ken Machida (IRPS, 2022)

Accelerator-Based Thermal-Neutron Beam by Compact and Low-Cost Moderator for Soft-Error Evaluation in Semiconductor Devices. - Taiki Uemura; Byungjin Chung; Jegon Kim; Hyewon Shim; Shin-Young Chung; Brandon Lee; Jaehee Choi; Shota Ohnishi; Ken Machida (IRPS, 2022)