Bipolar Dual-LFSR Reseeding for Low-Power Testing. - Jen-Cheng Ying; Wang-Dauh Tseng; Wen-Jiin Tsai (DSC, 2018)

Asymmetry dual-LFSR reseeding for low power BIST. - Jen-Cheng Ying; Wang-Dauh Tseng; Wen-Jiin Tsai (Integr., 2018)

Multi-Scan Architecture with Scan Chain Disabling Technique for Capture Power Reduction. - Jen-Cheng Ying; Wang-Dauh Tseng; Wen-Jiin Tsai (J. Inf. Sci. Eng., 2019)