Time-zero-variability and BTI impact on advanced FinFET device and circuit reliability. - Subhadeep Mukhopadhyay 002; Yung-Huei Lee; Jen-Hao Lee (Microelectron. Reliab., 2018)

A Low-Cost Vital-Sign Sensor Based on Bluetooth System. - Kang-Chun Peng; Jen-Hao Lee (ICCE-TW, 2020)

Comprehensive Study of Non-Conducting Stress Characteristics in Ultra-Scaled FinFET. - Jun-Yu Huang; Clement Huang; Kun-Chung Huang; Da-You Yang; Hsin-Jou Chuang; Yi-Wen Lee; Eliot Chen; Jen-Hao Lee; Ryan Lu (IRPS, 2025)