Single-Event Performance of Flip Flop Designs at the 5-nm Bulk FinFET Node at Near-Threshold Supply Voltages. - Jenna B. Kronenberg; Yoni Xiong; Nicholas J. Pieper; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2024)

Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems. - Nicholas J. Pieper; M. Chun; Yoni Xiong; H. M. Dattilo; Jenna B. Kronenberg; Sanghyeon Baeg; Shi-Jie Wen; Rita Fung; D. Chan; C. Escobar; Bharat L. Bhuva (IRPS, 2024)

Multiple Bit Upsets in Register Circuits at the 5-nm Bulk FinFET Node. - Yoni Xiong; Nicholas J. Pieper; Jenna B. Kronenberg; Dennis R. Ball; Megan Casey; Bharat L. Bhuva (IRPS, 2024)

Power-Aware Mitigation of Logic Soft Error Rates at the 3-nm Bulk FinFET Node. - Jenna B. Kronenberg; Y. Xiong; Nicholas J. Pieper; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2025)

Power and SER Performance of Flip-Flop Cells with Low-Leakage Options. - Nicholas J. Pieper; Y. Xiong; Jenna B. Kronenberg; R. Fung; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2025)