Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies. - Jennifer Dworak; Michael R. Grimaila; Sooryong Lee; Li-C. Wang; M. Ray Mercer (ITC, 1999)

REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. - Michael R. Grimaila; Sooryong Lee; Jennifer Dworak; Kenneth M. Butler; Bret Stewart; Hari Balachandran; Bryan Houchins; Vineet Mathur; Jaehong Park; Li-C. Wang; M. Ray Mercer (VTS, 1999)

On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction. - Jennifer Dworak; Michael R. Grimaila; Brad Cobb; Ting-Chi Wang; Li-C. Wang; M. Ray Mercer (Asian Test Symposium, 2000)

Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D. - Jennifer Dworak; Michael R. Grimaila; Sooryong Lee; Li-C. Wang; M. Ray Mercer (ITC, 2000)

Defect-Oriented Testing and Defective-Part-Level Prediction. - Jennifer Dworak; Jason D. Wicker; Sooryong Lee; Michael R. Grimaila; M. Ray Mercer; Kenneth M. Butler; Bret Stewart; Li-C. Wang (IEEE Des. Test Comput., 2001)

Enhancing test efficiency for delay fault testing using multiple-clocked schemes. - Jing-Jia Liou; Li-C. Wang; Kwang-Ting Cheng; Jennifer Dworak; M. Ray Mercer; Rohit Kapur; Thomas W. Williams (DAC, 2002)

A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults. - Sooryong Lee; Brad Cobb; Jennifer Dworak; Michael R. Grimaila; M. Ray Mercer (DATE, 2002)

Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults. - Jennifer Dworak; James Wingfield; Brad Cobb; Sooryong Lee; Li-C. Wang; M. Ray Mercer (DFT, 2002)

Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme. - Jing-Jia Liou; Li-C. Wang; Kwang-Ting Cheng; Jennifer Dworak; M. Ray Mercer; Rohit Kapur; Thomas W. Williams (ITC, 2002)

Function-Based Dynamic Compaction and its Impact on Test Set Sizes. - James Wingfield; Jennifer Dworak; M. Ray Mercer (DFT, 2003)

Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects. - Jennifer Dworak; Brad Cobb; James Wingfield; M. Ray Mercer (DATE, 2004)

A Preliminary Investigation of Observation Diversity for Enhancing Fortuitous Detection of Defects. - Jennifer Dworak; James Wingfield; M. Ray Mercer (DFT, 2004)

Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets. - Jennifer Dworak; David Dorsey; Amy Wang; M. Ray Mercer (VTS, 2004)

An Investigation of Excitation Balance and Additional Mandatory Conditions for the Diagnosis of Fortuitously Detected Defects. - Jennifer Dworak (MTV, 2005)

A cost-effective implementation of an ECC-protected instruction queue for out-of-order microprocessors. - Vladimir Stojanovic; R. Iris Bahar; Jennifer Dworak; Richard Weiss 001 (DAC, 2006)

Which defects are most critical? optimizing test sets to minimize failures due to test escapes. - Jennifer Dworak (ITC, 2007)

An Analysis of Defect Detection for Weighted Random Patterns Generated with Observation/Excitation-Aware Partial Fault Targeting. - Jennifer Dworak (VTS, 2007)

Efficient Determination of Fault Criticality for Manufacturing Test Set Optimization. - Yiwen Shi; Kellie DiPalma; Jennifer Dworak (DFT, 2008)

Using Implications for Online Error Detection. - Kundan Nepal; Nuno Alves; Jennifer Dworak; R. Iris Bahar (ITC, 2008)

Reducing Scan Shift Power at RTL. - Elif Alpaslan; Yu Huang 005; Xijiang Lin; Wu-Tung Cheng; Jennifer Dworak (VTS, 2008)

Detecting errors using multi-cycle invariance information. - Nuno Alves; Kundan Nepal; Jennifer Dworak; R. Iris Bahar (DATE, 2009)

Compacting test vector sets via strategic use of implications. - Nuno Alves; Jennifer Dworak; R. Iris Bahar; Kundan Nepal (ICCAD, 2009)

NIM- a noise index model to estimate delay discrepancies between silicon and simulation. - Elif Alpaslan; Jennifer Dworak; Bram Kruseman; Ananta K. Majhi; Wilmar M. Heuvelman; Paul van de Wiel (DATE, 2010)

Improving the testability and reliability of sequential circuits with invariant logic. - Nuno Alves; Kundan Nepal; Jennifer Dworak; R. Iris Bahar (ACM Great Lakes Symposium on VLSI, 2010)

Too many faults, too little time on creating test sets for enhanced detection of highly critical faults and defects. - Yiwen Shi; Wan-Chan Hu; Jennifer Dworak (VTS, 2010)

On Reducing Scan Shift Activity at RTL. - Elif Alpaslan; Yu Huang 005; Xijiang Lin; Wu-Tung Cheng; Jennifer Dworak (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010)

A Cost Effective Approach for Online Error Detection Using Invariant Relationships. - Nuno Alves; Alison Buben; Kundan Nepal; Jennifer Dworak; R. Iris Bahar (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010)

Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis. - Nuno Alves; Yiwen Shi; Nicholas Imbriglia; Jennifer Dworak; Kundan Nepal; R. Iris Bahar (ETS, 2011)

Partial state monitoring for fault detection estimation. - Yiwen Shi; Kantapon Kaewtip; Wan-Chan Hu; Jennifer Dworak (ITC, 2011)

Enhancing online error detection through area-efficient multi-site implications. - Nuno Alves; Yiwen Shi; Jennifer Dworak; R. Iris Bahar; Kundan Nepal (VTS, 2011)

NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test. - Elif Alpaslan; Bram Kruseman; Ananta K. Majhi; Wilmar M. Heuvelman; Jennifer Dworak (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Using implications to choose tests through suspect fault identification. - Jennifer Dworak; Kundan Nepal; Nuno Alves; Yiwen Shi; Nicholas Imbriglia; R. Iris Bahar (ACM Trans. Design Autom. Electr. Syst., 2012)

Built-in Self-Repair in a 3D die stack using programmable logic. - Kundan Nepal; Xi Shen; Jennifer Dworak; Theodore W. Manikas; R. Iris Bahar (DFTS, 2013)

Ternary Logic Network Justification Using Transfer Matrices. - Mitchell A. Thornton; Jennifer Dworak (ISMVL, 2013)

Don't forget to lock your SIB: Hiding instruments using P16871. - Jennifer Dworak; Al Crouch; John C. Potter; Adam Zygmontowicz; Micah Thornton (ITC, 2013)

Special session 4B: Elevator talks. - Jennifer Dworak; Ronald Shawn Blanton; Masahiro Fujita; Kazumi Hatayama; Naghmeh Karimi; Michail Maniatakos; Antonis M. Paschalis; Adit D. Singh; Tian Xia (VTS, 2013)

FPGA-Based Embedded Tester with a P1687 Command, Control, and Observe-System. - Alfred L. Crouch; John C. Potter; Ajay Khoche; Jennifer Dworak (IEEE Des. Test, 2013)

A Simulated Annealing Inspired Test Optimization Method for Enhanced Detection of Highly Critical Faults and Defects. - Yiwen Shi; Jennifer Dworak (J. Electron. Test., 2013)

Making it harder to unlock an LSIB: Honeytraps and misdirection in a P1687 network. - Adam Zygmontowicz; Jennifer Dworak; Al Crouch; John C. Potter (DATE, 2014)

Triggering Trojans in SRAM circuits with X-propagation. - Senwen Kan; Jennifer Dworak (DFT, 2014)

Board security enhancement using new locking SIB-based architectures. - Jennifer Dworak; Zoe Conroy; Alfred L. Crouch; John C. Potter (ITC, 2014)

When Optimized N-Detect Test Sets are Biased: An Investigation of Cell-Aware-Type Faults and N-Detect Stuck-At ATPG. - Fanchen Zhang; Micah Thornton; Jennifer Dworak (NATW, 2014)

Special session 4A: Elevator talks. - Jennifer Dworak (VTS, 2014)

Enhancing embedded SRAM security and error tolerance with hardware CRC and obfuscation. - Senwen Kan; Marco Ottavi; Jennifer Dworak (DFTS, 2015)

A case study: Leverage IEEE 1687 based method to automate modeling, verification, and test access for embedded instruments in a server processor. - Tassanee Payakapan; Senwen Kan; Ken Pham; Kathy Yang; Jean-Francois Cote; Martin Keim; Jennifer Dworak (ITC, 2015)

An Industrial Case Study: PaRent (Parallel & Concurrent) Testing for Complex Mixed-Signal Devices. - Jennifer Dworak; Ping Gui; Qutaiba Khasawneh (NATW, 2015)

A call to action: Securing IEEE 1687 and the need for an IEEE test Security Standard. - Jennifer Dworak; Al Crouch (VTS, 2015)

Repairing a 3-D Die-Stack Using Available Programmable Logic. - Kundan Nepal; Soha Alhelaly; Jennifer Dworak; R. Iris Bahar; Theodore W. Manikas; Ping Guikundan (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015)

Echeloned IJTAG data protection. - Senwen Kan; Jennifer Dworak; James George Dunham (AsianHOST, 2016)

Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture. - Fanchen Zhang; Daphne Hwong; Yi Sun; Allison Garcia; Soha Alhelaly; Geoff Shofner; LeRoy Winemberg; Jennifer Dworak (ITC, 2016)

A Case Study: Pre-Silicon SoC RAS Validation for NoC Server Processor. - Senwen Kan; Matthew Lam; Tyler Porter; Jennifer Dworak (MTV, 2016)

Using Existing Reconfigurable Logic in 3D Die Stacks for Test. - Fanchen Zhang; Yi Sun; Xi Shen; Kundan Nepal; Jennifer Dworak; Theodore W. Manikas; Ping Gui; R. Iris Bahar; Al Crouch; John C. Potter (NATW, 2016)

Systematic Test Generation for Secure Hardware Supported Virtualization. - Senwen Kan; Jennifer Dworak (DASC/PiCom/DataCom/CyberSciTech, 2017)

Increasing IJTAG bandwidth and managing security through parallel locking-SIBs. - Saurabh Gupta 005; Al Crouch; Jennifer Dworak; Daniel Engels (ITC, 2017)

Detecting a trojan die in 3D stacked integrated circuits. - Soha Alhelaly; Jennifer Dworak; Theodore W. Manikas; Ping Gui; Kundan Nepal; Alfred L. Crouch (NATW, 2017)

Mitigating simple power analysis attacks on LSIB key logic. - Saurabh Gupta 005; Jennifer Dworak; Daniel Engels; Al Crouch (NATW, 2017)

Can Soft Errors be Handled Securely? - Senwen Kan; Jennifer Dworak (ISVLSI, 2018)

IJTAG Integrity Checking with Chained Hashing. - Senwen Kan; Jennifer Dworak (ITC, 2018)

One more time! Increasing fault detection with scan shift capture. - Hui Jiang; Fanchen Zhang; Yi Sun; Jennifer Dworak (NATW, 2018)

Efficient parallel testing: A configurable and scalable broadcast network design using IJTAG. - Saurabh Gupta 005; Jae Wu; Jennifer Dworak (VTS, 2018)

Real-time monitoring of test fallout data to quickly identify tester and yield issues in a multi-site environment. - Qutaiba Khasawneh; Jennifer Dworak; Ping Gui; Benjamin Williams; Alan C. Elliott; Anand Muthaiah (VTS, 2018)

Test Architecture for Fine Grained Capture Power Reduction. - Yi Sun; Hui Jiang; Lakshmi Ramakrishnan; Matan Segal; Kundan Nepal; Jennifer Dworak; Theodore W. Manikas; R. Iris Bahar (ICECS, 2019)

Innovate Practices on CyberSecurity of Hardware Semiconductor Devices. - Alfred L. Crouch; Peter L. Levin; Jennifer Dworak; Lakshmi Ramakrishnan; Yuhe Xia; Chi Zhang; Daniel Engels; Gary Evans; Ping Gui; Scott McWilliams; Saurabh Gupta 005; Franco Stellari; et al. (VTS, 2019)

Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D Stack. - Yi Sun; Fanchen Zhang; Hui Jiang; Kundan Nepal; Jennifer Dworak; Theodore W. Manikas; R. Iris Bahar (J. Electron. Test., 2019)

Multi-Level Access Protection for Future IEEE P1687.1 IJTAG Networks. - David Brauchler; Jennifer Dworak (ITC, 2020)

A Novel Graph-Coloring-Based Solution for Low-Power Scan Shift. - Saurabh Gupta 005; Bonita Bhaskaran; Shantanu Sarangi; Ayub Abdollahian; Jennifer Dworak (IEEE Des. Test, 2020)

Low Power Shift and Capture through ATPG-Configured Embedded Enable Capture Bits. - Yi Sun; Hui Jiang; Lakshmi Ramakrishnan; Jennifer Dworak; Kundan Nepal; Theodore W. Manikas; R. Iris Bahar (ITC, 2021)

3D Ring Oscillator Based Test Structures to Detect a Trojan Die in a 3D Die Stack in the Presence of Process Variations. - Soha Alhelaly; Jennifer Dworak; Kundan Nepal; Theodore W. Manikas; Ping Gui; Alfred L. Crouch (IEEE Trans. Emerg. Top. Comput., 2021)

Harvesting Wasted Clock Cycles for Efficient Online Testing. - Eslam Yassien; Yongjia Xu; Hui Jiang; Thach Nguyen; Jennifer Dworak; Theodore W. Manikas; Kundan Nepal (ETS, 2023)

Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift. - Hui Jiang; Fanchen Zhang; Jennifer Dworak; Kundan Nepal; Theodore W. Manikas (J. Electron. Test., 2023)

Dual Use Circuitry for Early Failure Warning and Test. - Alexander Coyle; Hui Jiang; Jennifer Dworak; Theodore W. Manikas; Kundan Nepal (ISQED, 2024)

European Test Symposium Teams: an Anniversary Snapshot. - Maksim Jenihhin; Jaan Raik; Artur Jutman; Natalia Cherezova; Raimund Ubar; Liviu Miclea; Szilárd Enyedi; I. Stefan; Ovidiu Stan; Cosmina Corches; Z. Peng; Petru Eles; et al. (ETS, 2025)