Automatic Test Configuration and Pattern Generation (ATCPG) for Neuromorphic Chips. - I-Wei Chiu; Xin-Ping Chen; Jennifer Shueh-Inn Hu; James Chien-Mo Li (ICCAD, 2022)

Test Compression for Neuromorphic Chips. - Xin-Ping Chen; Hsu-Yu Huang; Chu-Yun Hsiao; Jennifer Shueh-Inn Hu; James Chien-Mo Li (ETS, 2024)