A Memory Specific Notation for Fault Modeling. - Zaid Al-Ars; Ad J. van de Goor; Jens Braun; Detlev Richter (Asian Test Symposium, 2001)

Simulation based analysis of temperature effect on the faulty behavior of embedded DRAMs. - Zaid Al-Ars; Ad J. van de Goor; Jens Braun; Detlev Richter (ITC, 2001)

Optimizing Stresses for Testing DRAM Cell Defects Using Electrical Simulation. - Zaid Al-Ars; Ad J. van de Goor; Jens Braun; Detlev Richter (DATE, 2003)

Algorithmic derivation of functional renormalization group equations and Dyson-Schwinger equations. - Markus Q. Huber; Jens Braun (Comput. Phys. Commun., 2012)