In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. - Robert Madge; Brady Benware; Ritesh P. Turakhia; W. Robert Daasch; Chris Schuermyer; Jens Ruffler (ITC, 2004)

Minimum Testing Requirements to Screen Temperature Dependent Defects. - Chris Schuermyer; Jens Ruffler; W. Robert Daasch (ITC, 2004)