At-speed BIST for interposer wires supporting on-the-spot diagnosis. - Shi-Yu Huang; Jeo-Yen Lee; Kun-Han Tsai; Wu-Tung Cheng (IOLTS, 2013)

Pulse-Vanishing Test for Interposers Wires in 2.5-D IC. - Shi-Yu Huang; Jeo-Yen Lee; Kun-Han Tsai; Wu-Tung Cheng (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014)