Design of a built-in current sensor for IDDQ testing. - Jeong Beom Kim; Sung Je Hong; Jong Kim 001 (IEEE J. Solid State Circuits, 1998)

Novel Current Sensing Circuit for IDDQ Testing. - Jeong Beom Kim (ICECS, 2006)

An 11Gb/s CMOS Demultiplexer Using Redundant Multi-valued Logic. - Jeong Beom Kim; Sun Hong Ahn (ICECS, 2006)

A CMOS Built-In Current Sensor for IDDQ Testing. - Jeong Beom Kim; Seung Ho Hong (IEICE Trans. Electron., 2006)

11-Gb/s CMOS Demultiplexer Using Redundant Multi-Valued Logic. - Sun Hong Ahn; Jeong Beom Kim (IEICE Trans. Electron., 2007)

Current Mode CMOS Quaternary Logic Full-Adder. - Jeong Beom Kim (J. Circuits Syst. Comput., 2009)