Comparisons of classification methods in the original and pattern spaces. - Jeong Han; Norman Kim; Myong K. Jeong; Bong-Jin Yum (Expert Syst. Appl., 2011)

Pattern selection approaches for the logical analysis of data considering the outliers and the coverage of a pattern. - Jeong Han; Norman Kim; Bong-Jin Yum; Myong K. Jeong (Expert Syst. Appl., 2011)

Experiment of Image Processing Algorithm for Efficient Pothole Detection. - Sung Won Lee 006; SeokJin Kim; Jeong Han; KwangEun An; Seung-Ki Ryu; Dongmahn Seo (ICCE, 2019)