12.2 A 7nm FinFET SRAM macro using EUV lithography for peripheral repair analysis. - Taejoong Song; Hoonki Kim; Woojin Rim; Yongho Kim; Sunghyun Park 003; Changnam Park; Minsun Hong; Giyong Yang; Jeongho Do; Jinyoung Lim; Seungyoung Lee; Ingyum Kim; et al. (ISSCC, 2017)

A 7nm FinFET SRAM using EUV lithography with dual write-driver-assist circuitry for low-voltage applications. - Taejoong Song; Jonghoon Jung; Woojin Rim; Hoonki Kim; Yongho Kim; Changnam Park; Jeongho Do; Sunghyun Park 003; Sungwee Cho; Hyuntaek Jung; Bongjae Kwon; Hyun-Su Choi; et al. (ISSCC, 2018)