Position Detection Performance Improvement for LSM Control in Super Speed Maglev. - Jinho Lee; Jeongmin Jo; Youngjae Han; Changyoung Lee (ICIRA (1), 2013)

Aging-Aware Design Verification Methods Under Real Product Operating Conditions. - Hyewon Shim; Jeongmin Jo; Yoohwan Kim; Bongyong Jeong; Minji Shon; Hai Jiang 005; Sangwoo Pae (IRPS, 2019)

Reliability of Industrial grade Embedded-STT-MRAM. - Yongsung Ji; Hyunjae Goo; Jungman Lim; Tae-Young Jeong; Taiki Uemura; Gun Rae Kim; Boil Seo; Seungbae Lee; Goeun Park; Jeongmin Jo; Sang-Il Han; Kilho Lee; et al. (IRPS, 2020)

Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM. - Taiki Uemura; Byungjin Chung; Jeongmin Jo; Hai Jiang 005; Yongsung Ji; Tae-Young Jeong; Rakesh Ranjan; Seungbae Lee; Hwasung Rhee; Sangwoo Pae; Euncheol Lee; Jaehee Choi; et al. (IRPS, 2020)

Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET. - Taiki Uemura; Byungjin Chung; Jeongmin Jo; Hai Jiang 005; Yongsung Ji; Tae-Young Jeong; Rakesh Ranjan; Youngin Park; Kiil Hong; Seungbae Lee; Hwasung Rhee; Sangwoo Pae; et al. (IRPS, 2020)

A Position Estimator Using Kalman Filter With a Data Rejection Filter for a Long-Stator Linear Synchronous Motor of Maglev. - Jeongmin Jo; Seok Y. Lee; Kwangjoo Lee; Ye Jun Oh; Su Y. Choi; Chang-Young Lee; Kwansup Lee (IEEE Access, 2020)

Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology. - Taiki Uemura; Byungjin Chung; Jeongmin Jo; Mijoung Kim; Dalhee Lee; Gunrae Kim; Seungbae Lee; Taesjoong Song; Hwasung Rhee; Brandon Lee; Jaehee Choi (IRPS, 2021)

A Preliminary Study of Multimodal Feedback Interfaces in Takeover Transition of Semi-Autonomous Vehicles. - Jeonguk Hong; Sangyeon Kim; Gyewon Jeon; Sanghyeok Boo; Jeongmin Jo; Jieun Park; Seoyoon Jung; Jiwon Park; Sangwon Lee 009 (AutomotiveUI (Adjunct Proceedings), 2022)

Read It Now, Not Later! Integrating Semantic Recommendation into In-Browser Web Page Scrap Tool. - Jeongmin Jo; Sangyeon Kim; Sangwon Lee 009 (CHI Extended Abstracts, 2023)

An Analysis of CDM-induced BTI-like Degradation using VF-TLP in Advanced FinFET Technology. - Sangmin Oh; Taeyoung Jeong; Junghwan Yum; Minhyuk Lim; Yoohwan Kim; Bongyong Jeong; Jeongmin Jo; Hyewon Shim; Shin-Young Chung; Paul Jung (IRPS, 2024)

Exploring the Mental Model of Web Page Scrap: Design Suggestion of an AI-Powered In-Browser Scrap Tool and Its Usability Evaluation. - Jeongmin Jo; Sangyeon Kim; Sangwon Lee 009 (Int. J. Hum. Comput. Interact., 2025)