Self-correcting Flip-flops for Triple Modular Redundant Logic in a 12-nm Technology. - Lawrence T. Clark; Alen Duvnjak; Clifford Young-Sciortino; Matthew Cannon; John S. Brunhaver; Sapan Agarwal; Jereme Neuendank; Donald Wilson; Hugh J. Barnaby; Matthew J. Marinella (ISCAS, 2022)

On-Chip Characterization of Random Telegraph Signal Noise in Bulk 90 nm CMOS. - J. Kim; T. Daniel Loveless; J. Pew; R. Young; D. Reising; M. Nour; P. Manos; M. Chambers; Hugh J. Barnaby; Jereme Neuendank (IRPS, 2024)