Impact of Resistive-Bridge Defects in TAS-MRAM Architectures. - Joao Azevedo; Arnaud Virazel; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Aida Todri; Guillaume Prenat; Jérémy Alvarez-Herault; Ken Mackay (Asian Test Symposium, 2012)

Impact of resistive-open defects on the heat current of TAS-MRAM architectures. - Joao Azevedo; Arnaud Virazel; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Aida Todri-Sanial; Guillaume Prenat; Jérémy Alvarez-Herault; Ken Mackay (DATE, 2012)

Coupling-based resistive-open defects in TAS-MRAM architectures. - Joao Azevedo; Arnaud Virazel; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Aida Todri; Guillaume Prenat; Jérémy Alvarez-Herault; Ken Mackay (ETS, 2012)

Scalability and logic functionalities of TA-MRAMs. - Ioan Lucian Prejbeanu; Ricardo C. Sousa; Bernard Dieny; Jean-Pierre Nozieres; S. Bandiera; Jérémy Alvarez-Herault; Q. Stainer; L. Lombard; Clarisse Ducruet; Y. Conraux; Ken Mackay (NEWCAS, 2013)

A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs. - Joao Azevedo; Arnaud Virazel; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Aida Todri-Sanial; Jérémy Alvarez-Herault; Ken Mackay (IEEE Trans. Very Large Scale Integr. Syst., 2014)

Automated characterization of TAS-MRAM test arrays. - Alessandro Grossi; Cristian Zambelli; Piero Olivo; Paolo Pellati; Michele Ramponi; Jérémy Alvarez-Herault; Ken Mackay (DTIS, 2015)

Reliability and cell-to-cell variability of TAS-MRAM arrays under cycling conditions. - Alessandro Grossi; Cristian Zambelli; Piero Olivo; Jérémy Alvarez-Herault; Ken Mackay (NVMTS, 2015)

An Automated Test Equipment for Characterization of Emerging MRAM and RRAM Arrays. - Alessandro Grossi; Cristian Zambelli; Piero Olivo; Paolo Pellati; Michele Ramponi; Christian Wenger; Jérémy Alvarez-Herault; Ken Mackay (IEEE Trans. Emerg. Top. Comput., 2018)